1132_Materials Analysis by X-ray_345795
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Course Intro

Course Resources

  • Introduction
  • X-ray History
  • Fourier Transformation
  • Characteristic X-ray Line
  • [錄]Introduction 02190942
  • XRD_calculation
  • [錄]XRD intrument introduction 02260928
  • [錄]Database and Structure visualization 02261057
  • [錄]X-ray history and characteristic 03050934
  • [錄]X-ray history and characteristic(II) 03051054
  • [錄]Introudction to X-ray characteristric and analysis 03121048
  • [錄]Introudction to X-ray absorption and Fluorescence 03120926
  • X-ray spectroscopy
  • Level I Crystallography
  • Fourier Transform
  • [錄]Level 1 Crystallography 03260929
  • [錄]Level 1 Crystallography -practice -simple cell transformation 03261050
  • LaB6-xrd
  • KNiF3 xrd
  • [錄]Data analysis -example : Index 04021043
  • KNiF3-new
  • [錄]from singe crystal to powder x-ray diffraction 04090938
  • [錄]from singe crystal to powder x-ray diffraction 04091056
  • [錄]Practical : case demo and calculation 04230955
  • [錄]Symmetry (I) 04231038
  • [錄]GIXRD-Practicals -demo 04300932
  • [錄]Space group - brief 04301032
  • [錄]Diffraction (I) 04301137
  • atomic scattering factor
  • Draw XRD profile
  • [錄]Practicals - Draw atomic scattering factor and xrd profile 05070936
  • [錄]Structure factor 05141002
  • [錄]Practicals -Centering 05141127
  • [錄]Profile fitting and data anaysis 05280943
  • [錄]Profile fitting and data anaysis 05281202
  • Rietveld refinement guideline
  • Introduction to Rietveld refinement
  • [錄]Rietveld reinement and praticals(I) 06040952
  • [錄]Rietveld reinement and praticals(I) 06041115
  • ZnO
  • KNiF3-700s
  • LaB6
  • [錄]Rietveld refinement(II)-Practical 06110928
  • [錄]Rietveld refinement(II)-Practical-2 06111118
  • Final Exam and Report
  • GSASII-in-house instrumental file
  • [錄]Final Review -from diffraction peaks to structure refinement 06181036
  • [錄]Final Review -Rietveld refinement 06181135
  • SiO2-finalreport
  • ZnO-finalreport
  • Y2O3-finalreport
  • refinement-report-template
Teacher / 許益瑞

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