1132_X光在材料分析上的應用_345795
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課程介紹

課程資源

  • Introduction
  • X-ray History
  • Fourier Transformation
  • Characteristic X-ray Line
  • [錄]Introduction 02190942
  • XRD_calculation
  • [錄]XRD intrument introduction 02260928
  • [錄]Database and Structure visualization 02261057
  • [錄]X-ray history and characteristic 03050934
  • [錄]X-ray history and characteristic(II) 03051054
  • [錄]Introudction to X-ray characteristric and analysis 03121048
  • [錄]Introudction to X-ray absorption and Fluorescence 03120926
  • X-ray spectroscopy
  • Level I Crystallography
  • Fourier Transform
  • [錄]Level 1 Crystallography 03260929
  • [錄]Level 1 Crystallography -practice -simple cell transformation 03261050
  • LaB6-xrd
  • KNiF3 xrd
  • [錄]Data analysis -example : Index 04021043
  • KNiF3-new
  • [錄]from singe crystal to powder x-ray diffraction 04090938
  • [錄]from singe crystal to powder x-ray diffraction 04091056
  • [錄]Practical : case demo and calculation 04230955
  • [錄]Symmetry (I) 04231038
  • [錄]GIXRD-Practicals -demo 04300932
  • [錄]Space group - brief 04301032
  • [錄]Diffraction (I) 04301137
  • atomic scattering factor
  • Draw XRD profile
  • [錄]Practicals - Draw atomic scattering factor and xrd profile 05070936
  • [錄]Structure factor 05141002
  • [錄]Practicals -Centering 05141127
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