1132_X光在材料分析上的應用_345795
報名期間：從 即日起 到 無限期
上課期間：從 即日起 到 無限期
LINE分享功能只支援行動裝置
課程介紹
課程資源
-
Introduction
-
X-ray History
-
Fourier Transformation
-
Characteristic X-ray Line
-
[錄]Introduction 02190942
-
XRD_calculation
-
[錄]XRD intrument introduction 02260928
-
[錄]Database and Structure visualization 02261057
-
[錄]X-ray history and characteristic 03050934
-
[錄]X-ray history and characteristic(II) 03051054
-
[錄]Introudction to X-ray characteristric and analysis 03121048
-
[錄]Introudction to X-ray absorption and Fluorescence 03120926
-
X-ray spectroscopy
-
Level I Crystallography
-
Fourier Transform
-
[錄]Level 1 Crystallography 03260929
-
[錄]Level 1 Crystallography -practice -simple cell transformation 03261050
-
LaB6-xrd
-
KNiF3 xrd
-
[錄]Data analysis -example : Index 04021043
-
KNiF3-new
-
[錄]from singe crystal to powder x-ray diffraction 04090938
-
[錄]from singe crystal to powder x-ray diffraction 04091056
-
[錄]Practical : case demo and calculation 04230955
-
[錄]Symmetry (I) 04231038
-
[錄]GIXRD-Practicals -demo 04300932
-
[錄]Space group - brief 04301032
-
[錄]Diffraction (I) 04301137
-
atomic scattering factor
-
Draw XRD profile
-
[錄]Practicals - Draw atomic scattering factor and xrd profile 05070936
-
[錄]Structure factor 05141002
-
[錄]Practicals -Centering 05141127
-
[錄]Profile fitting and data anaysis 05280943
-
[錄]Profile fitting and data anaysis 05281202
-
Rietveld refinement guideline
-
Introduction to Rietveld refinement
-
[錄]Rietveld reinement and praticals(I) 06040952
-
[錄]Rietveld reinement and praticals(I) 06041115
-
ZnO
-
KNiF3-700s
-
LaB6
-
[錄]Rietveld refinement(II)-Practical 06110928
-
[錄]Rietveld refinement(II)-Practical-2 06111118
-
Final Exam and Report
-
GSASII-in-house instrumental file
-
[錄]Final Review -from diffraction peaks to structure refinement 06181036
-
[錄]Final Review -Rietveld refinement 06181135
-
SiO2-finalreport
-
ZnO-finalreport
-
Y2O3-finalreport
-
refinement-report-template
教師 / 許益瑞
相關課程
|
|
||||||
|
|
|
||||||
|
|
|
||||||
|
|
|
||||||
|