1132_X光在材料分析上的应用_345795
报名期间：从 即日起 到 无限期
上课期间：从 即日起 到 无限期
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课程介绍
课程资源
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Introduction
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X-ray History
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Fourier Transformation
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Characteristic X-ray Line
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[錄]Introduction 02190942
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XRD_calculation
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[錄]XRD intrument introduction 02260928
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[錄]Database and Structure visualization 02261057
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[錄]X-ray history and characteristic 03050934
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[錄]X-ray history and characteristic(II) 03051054
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[錄]Introudction to X-ray characteristric and analysis 03121048
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[錄]Introudction to X-ray absorption and Fluorescence 03120926
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X-ray spectroscopy
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Level I Crystallography
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Fourier Transform
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[錄]Level 1 Crystallography 03260929
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[錄]Level 1 Crystallography -practice -simple cell transformation 03261050
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LaB6-xrd
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KNiF3 xrd
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[錄]Data analysis -example : Index 04021043
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KNiF3-new
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[錄]from singe crystal to powder x-ray diffraction 04090938
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[錄]from singe crystal to powder x-ray diffraction 04091056
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[錄]Practical : case demo and calculation 04230955
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[錄]Symmetry (I) 04231038
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[錄]GIXRD-Practicals -demo 04300932
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[錄]Space group - brief 04301032
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[錄]Diffraction (I) 04301137
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atomic scattering factor
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Draw XRD profile
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[錄]Practicals - Draw atomic scattering factor and xrd profile 05070936
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[錄]Structure factor 05141002
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[錄]Practicals -Centering 05141127
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[錄]Profile fitting and data anaysis 05280943
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[錄]Profile fitting and data anaysis 05281202
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Rietveld refinement guideline
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Introduction to Rietveld refinement
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[錄]Rietveld reinement and praticals(I) 06040952
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[錄]Rietveld reinement and praticals(I) 06041115
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ZnO
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KNiF3-700s
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LaB6
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[錄]Rietveld refinement(II)-Practical 06110928
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[錄]Rietveld refinement(II)-Practical-2 06111118
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Final Exam and Report
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GSASII-in-house instrumental file
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[錄]Final Review -from diffraction peaks to structure refinement 06181036
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[錄]Final Review -Rietveld refinement 06181135
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SiO2-finalreport
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ZnO-finalreport
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Y2O3-finalreport
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refinement-report-template
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