1132_X光在材料分析上的应用_345795
报名期间：从 即日起 到 无限期
上课期间：从 即日起 到 无限期
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课程介绍
课程资源
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Introduction
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X-ray History
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Fourier Transformation
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Characteristic X-ray Line
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[錄]Introduction 02190942
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XRD_calculation
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[錄]XRD intrument introduction 02260928
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[錄]Database and Structure visualization 02261057
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[錄]X-ray history and characteristic 03050934
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[錄]X-ray history and characteristic(II) 03051054
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[錄]Introudction to X-ray characteristric and analysis 03121048
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[錄]Introudction to X-ray absorption and Fluorescence 03120926
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X-ray spectroscopy
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Level I Crystallography
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Fourier Transform
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[錄]Level 1 Crystallography 03260929
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[錄]Level 1 Crystallography -practice -simple cell transformation 03261050
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LaB6-xrd
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KNiF3 xrd
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[錄]Data analysis -example : Index 04021043
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KNiF3-new
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[錄]from singe crystal to powder x-ray diffraction 04090938
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[錄]from singe crystal to powder x-ray diffraction 04091056
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[錄]Practical : case demo and calculation 04230955
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[錄]Symmetry (I) 04231038
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[錄]GIXRD-Practicals -demo 04300932
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[錄]Space group - brief 04301032
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[錄]Diffraction (I) 04301137
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atomic scattering factor
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Draw XRD profile
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[錄]Practicals - Draw atomic scattering factor and xrd profile 05070936
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[錄]Structure factor 05141002
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[錄]Practicals -Centering 05141127
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