1141_Modern X-Ray Techniques and Materials Analysis_352486
Registration：Now ~ Any Time
Course Period：Now ~ Any Time
LINE sharing feature only supports mobile devices
Course Intro
Course Resources
-
Introduction
-
[錄]Introduction 09101543
-
Introduction to X-ray Spectroscopy
-
Introduction to EXAFS and data analysis
-
NiO-EXAFS data
-
[錄]EXAFS-1 09241528
-
[錄]XAS data analysis (I) 10071322
-
[錄]Exafs-fitting 10151523
-
[錄]Level-I Introduction to X-ray diffraction 10221522
-
Practicals -XRD calc. 20251029
-
KNiF3_Ka1_expt_data
-
[錄]XRD calc. & Practicals 10291533
-
Level-I_Introduction X-ray Diffraction
-
fitting_XRD_peak (I)
-
[錄]fitting-XRD peak (I) 11121524
-
Rietveld refinement (I)
-
Rietveld refinement (II)
-
[錄]Rietveld refinement (II) 11261531
-
[錄]Rietveld refinement (III) 11261634
-
Y2O3_22KeV_xrd
-
GSAS_instrument file
-
Rietveld practical note
-
[錄]phase probem -electron density 12101529
-
[錄]Rietveld refinment 12171529
-
NSRRCTPS15A-sugar-reflection
-
sugar ins file
-
Rigaku-workshop-CHNOS reflection
-
[錄]single crystal x-ray diffracion analysis 12241544
-
Final report
-
carbamato reflection
-
carbamato ins file
-
KNiF3_nsrrc data
-
TPS19A_instrum file
Teacher / 許益瑞
Related Courses
|
|
||||||
|
|
|
||||||
|
|
|
||||||
|
|
|
||||||
|