1141_現代X光技術與材料分析_352486
報名期間：從 即日起 到 無限期
上課期間：從 即日起 到 無限期
LINE分享功能只支援行動裝置
課程介紹
課程資源
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Introduction
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[錄]Introduction 09101543
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Introduction to X-ray Spectroscopy
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Introduction to EXAFS and data analysis
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NiO-EXAFS data
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[錄]EXAFS-1 09241528
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[錄]XAS data analysis (I) 10071322
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[錄]Exafs-fitting 10151523
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[錄]Level-I Introduction to X-ray diffraction 10221522
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Practicals -XRD calc. 20251029
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KNiF3_Ka1_expt_data
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[錄]XRD calc. & Practicals 10291533
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Level-I_Introduction X-ray Diffraction
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fitting_XRD_peak (I)
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[錄]fitting-XRD peak (I) 11121524
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Rietveld refinement (I)
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Rietveld refinement (II)
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[錄]Rietveld refinement (II) 11261531
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[錄]Rietveld refinement (III) 11261634
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Y2O3_22KeV_xrd
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GSAS_instrument file
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Rietveld practical note
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[錄]phase probem -electron density 12101529
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[錄]Rietveld refinment 12171529
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NSRRCTPS15A-sugar-reflection
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sugar ins file
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Rigaku-workshop-CHNOS reflection
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[錄]single crystal x-ray diffracion analysis 12241544
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Final report
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carbamato reflection
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carbamato ins file
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KNiF3_nsrrc data
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TPS19A_instrum file
教師 / 許益瑞
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