1131_Advanced VLSI Design_338712
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Course Intro
Course Resources
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1130913_lec1
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[錄] 09130911
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1130920_lec2
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[錄] 09200912
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Fick-Analog-In-Memory-Subthreshold-Deep-Neural-Network-Accelerator
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Hot Carrier Injection Reliability in Nanoscale Field Effect
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Reliability Effects on MOS Transistors Due to Hot-Carrier Injection
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[錄] 09270909
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1130927_lec3
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1131004_lec4
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[錄] 10040913
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[錄] 10180909
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1131018_lec5
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[錄] 10250906
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1131025_lec6
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[錄] 11010910
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1131101_lec7
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[錄] 11080911
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1131108_lec8
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1131122_lec9
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[錄] 11220909
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[錄] 11290929
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1131129_lec10
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1131206_lec11
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[錄] 12060910
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Prospective of semiconductor memory devices
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A 3T Gain Cell Embedded DRAM Utilizing Preferential Boosting for High Density and Low Power On-Die Caches
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[錄] 12130920
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1131213_lec12
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1131220_lec13
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Power_modelling_Survey__IEEE_TCAD_final (PowerMill)
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Yield Estimation of SRAM and Design of a Dual Functionality Read-Write Driver for SRAM
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[錄] 12200913
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[錄] 12270918
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[錄] 01030909
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[錄] 01100904
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