1131_高等积体电路设计_338712
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上课期间:从 即日起 到 无限期
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课程介绍

课程资源

  • 1130913_lec1
  • [錄] 09130911
  • 1130920_lec2
  • [錄] 09200912
  • Fick-Analog-In-Memory-Subthreshold-Deep-Neural-Network-Accelerator
  • Hot Carrier Injection Reliability in Nanoscale Field Effect
  • Reliability Effects on MOS Transistors Due to Hot-Carrier Injection
  • [錄] 09270909
  • 1130927_lec3
  • 1131004_lec4
  • [錄] 10040913
  • [錄] 10180909
  • 1131018_lec5
  • [錄] 10250906
  • 1131025_lec6
  • [錄] 11010910
  • 1131101_lec7
  • [錄] 11080911
  • 1131108_lec8
  • 1131122_lec9
  • [錄] 11220909
  • [錄] 11290929
  • 1131129_lec10
  • 1131206_lec11
  • [錄] 12060910
  • Prospective of semiconductor memory devices
  • A 3T Gain Cell Embedded DRAM Utilizing Preferential Boosting for High Density and Low Power On-Die Caches
  • [錄] 12130920
  • 1131213_lec12
  • 1131220_lec13
  • Power_modelling_Survey__IEEE_TCAD_final (PowerMill)
  • Yield Estimation of SRAM and Design of a Dual Functionality Read-Write Driver for SRAM
  • [錄] 12200913
  • [錄] 12270918
  • [錄] 01030909
  • [錄] 01100904
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