1112_Characterization of Materials_314520
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Course Intro
Course Resources
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近代材料分析测试方法
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Practical Materials Characterization
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material and device characterization
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材料分析儀器
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Experimental Physics
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Modern Spectroscopy
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Basics of Electrochemical Impedance Spectroscopy
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奈米材料之量測技術
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Molecular and Atomic Spectroscopy
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[錄] 03061412
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[錄] 03061525
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[錄] 03131411
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[錄] 03201415
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Raman Fundamentals - Electrodynamic Theor
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Introduction to Raman spectroscopy, Oxford Instruments 2020
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RAMAN SPECTROSCOPY MASTER CLASS
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[錄] 03271412
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Quantifying domain wall contributions to properties using X-rays
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Ultrafast Ultrasound Imaging Basic Principles and Applications
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Basic Principles of MRI: Episode 1-2 (lectured by Prof. Tseng
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Basic Principles of MRI: Episode 3-4 (lectured by Prof. Tseng
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How MRI Works - Part 1 - NMR Basics
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How MRI Works - Part 2 - The Spin Echo
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How MRI Works - Part 3 - Fourier Transform and K-Space
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LIGHT AND SOUND: INTEGRATING PHOTONICS WITH ULTRASONICS
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SiPM: Operation, performance, and possible applications
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What can I learn about ferroelectrics with Raman spectroscopy?
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Fundamentals and Applications of UV Vis Spectroscopy
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UV-Vis-NIR Spectroscopy for Optoelectronic Devices and Materials State of the Art
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Introduction to UV-vis Spectroscopy
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UV Spectroscopy - The Instrument
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An Introduction to Light Emission Spectroscopy: Theory and Materials Characterization Applications
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[錄] 04101418
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[錄] 04101522
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[錄] 04241411
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[錄] 05011414
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Introducing to laser diffraction
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Laser Scanning Techniques and Applications
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Thermal Analysis Techniques in Materials Characterization
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How Does Atomic Force Microscopy Work and What It Can Do | Bruker
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N anoscale Research Using AFM & Techniques:Principles of AFM imaging modes | Park Webina
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[錄] 05081426
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[錄] 05151411
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[錄] 05221415
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[錄] 05291412
Teacher / 王錫九
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